Aehr Test Systems, a supplier of semiconductor test and burn-in equipment, announced the first order for a FOX-NP™ wafer level test and burn-in system and a FOX WaferPak™ Aligner for gallium nitride power devices.
The customer is a GaN semiconductor maker and will use them in EVs and charging infrastructure.
The company chose Aehr due to its ability to offer a total solution that allows customers to apply thermal and electrical stress conditions to thousands of devices while still in wafer form. Aehr’s technology provides critical geolocation information across the wafer while inducing the extrinsic (early life) failures that would otherwise fail in the field without reducing the long-term reliability or life of the good devices.
Aehr enables its customers to cost-effectively implement the needed testing and qualification process for semiconductor devices that experience early life failures by applying the electrical stress condition to every device on the wafer and by testing up to 18 wafers at a time using the FOX-XP production test and burn-in system.
These electrical tests are done with up to thousands of precise calibrated electrical sources and measurement instruments per wafer. These tests are done while maintaining the temperature at an accurately programmed thermal temperature across each wafer using a direct conduction thermal transfer via a proprietary patented precision thermal chuck per wafer.
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